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CMOS Gate-Stack Scaling -- Materials, Interfaces and Reliability Implications: Volume 1155

ISBN: 9781605111285

Contributors: Demkov, Alexander A (Editor)
Taylor, Bill (Editor)
Harris, H Rusty (Editor)
Butterbaugh, Jeffery W (Editor)
Rachmady, Willy (Editor)

Publisher: Cambridge University Press, 2009

Binding: Hardcover (Readerbound Available)

Retail: $119.00

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1 copy: $119.00
2+ copies: $119.00

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    Citation: pg. 1

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    Review: Child's Book Association